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### $Id: Semi2.q,v 1.1 1999/10/13 00:50:09 saikat Exp $### Analysis of the Oxide layer thickness data given as data set 4.4 in### "SAS System for Mixed Models"options(contrasts = c(factor = "contr.SAS", ordered = "contr.poly"))formula(Semi2)plot(Semi2)fm1Semi2 <- lme( Thickness ~ 1, data = Semi2,random = ~ 1 | Lot/Wafer, method = "ML" )summary( fm1Semi2 )fm1RSemi2 <- update( fm1Semi2, method = "REML" )summary( fm1RSemi2 ) # compare with output 4.13, p. 156fm2Semi2 <- update( fm1Semi2, Thickness ~ Source )anova( fm1Semi2, fm2Semi2 )## Again, the p-value is smaller than that for the F test.fm2RSemi2 <- update( fm2Semi2, method = "REML" )summary( fm2RSemi2 ) # compare with output 4.15, p. 159fm3Semi2 <- update( fm2Semi2,random = list(Lot = pdDiag( ~ Source - 1 ), Wafer = ~ 1 ) )summary( fm3Semi2 )fm3RSemi2 <- update( fm3Semi2, method = "REML" )summary( fm3RSemi2 ) # compare with output 4.17, p. 163anova( fm1Semi2, fm2Semi2, fm3Semi2 )